Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. However, test engineering is still a relatively unknown profession compared to IC design engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many textbooks have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement. An Introduction to Mixed-Signal IC Test and Measurement is a textbook for advanced undergraduate and graduate-level students as well as engineering professionals. It was written in response to the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. This text encompasses the testing of both analog and mixed-signal circuits including many borderline examples. Digital testing is covered, but not as extensively because of the wealth of information on this topic already available. Examples and illustrations using state-of-the-art industrial technology enrich and enliven the presentation throughout. In considering the applications of this technology, the testing of large-scale mixed-signal circuits and individual circuits is introduced. The value-added benefits of mixed-signal IC testing to a manufacturer's product are clearly discussed, and the role of the test engineer is clearly defined.

Chapter 1: Overview of Mixed-Signal Testing 1.1. Mixed-Signal Ciruits 1.2. Why Test Mixed-Signal Devices 1.3. Post-Silicon Production Flow 1.4. Test and Diagnostic Equipment 1.5. New Product Development 1.6. Mixed-Signal Testing Challenges Chapter 2: The Test Specification Process 2.1. Device Data Sheets 2.2. Generating the Test Plan 2.3. Components of a Test Program 2.4. Summary Chapter 3: DC and Parametric Measurements 3.1. Continuity 3.2. Leakage Currents 3.3. Power Supply Currents 3.4. DC References and Regulators 3.5. Impedance Measurements 3.6. DC Offset Measurements 3.7. DC Gain Measurements 3.8. DC Power Supply Rejection Ratio 3.9. DC Common Mode Rejection Ratio 3.10. Comparator DC Tests 3.11. Voltage Search Techniques 3.12. DC Tests for Digital Circuits 3.13. Summary Chapter 4: Measurement Accuracy 4.1. Terminology 4.2. Calibrations and Checkers 4.3. Dealing with Measurement Error 4.4. Basic Data Analysis 4.5. Summary Chapter 5: Tester Hardware 5.1. Mixed-Signal Tester Overview 5.2. DC Resources 5.3. Digital Subsystem 5.4. AC Source and Measurement 5.5. Time Measurement System 5.6. Computing Hardware 5.7. Summary Chapter 6: Sampling Theory 6.1. Analog Measurements Using DSP 6.2. Sampling and Reconstruction 6.3. Repetitive Sample Sets 6.4. Synchronization of Sampling Systems 6.5. Summary Chapter 7: DSP-Based Testing 7.1. Advantages of DSP-Based Testing 7.2. Digital Signal Processing 7.3. Discrete-Time Transforms 7.4. The Inverse FFT 7.5. Summary Chapter 8: Analog Channel Testing 8.1. Overview 8.2. Gain and Level Tests 8.3. Phase Tests 8.4. Distortion Tests 8.5. Signal Rejection Tests 8.6. Noise Tests 8.7. Simulation of Analog Channel Tests 8.8. Summary Chapter 9: Sampled Channel Testing 9.1. Overview 9.2. Sampling Considerations 9.3. Encoding and Decoding 9.4. Sampled Channel Tests 9.5. Summary Chapter 10: Focused Calibrations 10.1. Overview 10.2. DC Calibrations 10.3. AC Amplitude Calibrations 10.4. Other AC Calibrations 10.5. Error Cancellation Techniques 10.6. Summary Chapter 11: DAC Testing 11.1. Basics of Converter Testing 11.2. Basic DC Tests 11.3. Transfer Curve Tests 11.4. Dynamic DAC Tests 11.5. DAC Architectures 11.6. Summary Chapter 12: ADC Testing 12.1. ADC Testing Versus DAC Testing 12.2. ADC Code Edge Measurements 12.3. DC Tests and Transfer Curve Tests 12.4. Dynamic ADC Tests 12.5. ADC Architectures 12.6. Tests for Common ADC Applications 12.7. Summary Chapter 13: DIB Design 13.1. DIB Basics 13.2. Printed Circuit Boards (PCBS) 13.3. DIB Traces, Shields, and Guards 13.4. Transmission Lines 13.5. Grounding and Power Distribution 13.6. DIB Components 13.7. Common DIB Circuits 13.8. Common DIB Mistakes 13.9. Summary Chapter 14: Design for Test (DfT) 14.1. Overview 14.2. Advantages of DfT 14.3. Digital Scan 14.4. Digital BIST 14.5. Digital DfT for Mixed-Signal Circuits 14.6. Mixed-Signal Boundary Scan and BIST 14.7. Ad Hoc Mixed-Signal DfT 14.8. Subtle Forms of Analog DFT 14.9. IDDQ 14.10. Summary Chapter 15: Data Analysis 15.1. Introduction to Data Analysis 15.2. Data Visualization Tools 15.3. Statistical Analysis 15.4. Statistical Process Control (SPC) 15.5. Summary Chapter 16: Test Economics 16.1. Profitability Factors 16.2. Direct Testing Costs 16.3. Debugging Skills 16.4. Emerging Trends 16.5. Summary

Mark Burns, Gordon W. RobertsProfessor in the Department of Electrical and Computer Engineering, McGill University